The Microscopy Suite of the Core University Research Resource Laboratory (CURRL), located on the main campus of New Mexico State University in Las Cruces, is an evolving core facility, administered by the Office of the Vice President for Research and equipped with modern transmission and scanning electron microscopes, a new spectral confocal microscope with UV-VIS optics and a digital imaging stereo-fluorescence microscope. These sophisticated tools are readily accessible as research and training resources for intramural and extramural researchers, educators and students. The research staff of the Laboratory provides support and guidance for a broad range of short-term microscopic imaging tasks and long-term integrated projects. 

Dimension FastScan atomic force microscope

  • High performance XYZ closed-loop scanning head
  • High scan rates with very low drift and noise
  • Intuitive workflow of the graphical user interface
  • Automated laser and detector alignments
  • Quick and easy sample navigation
  • A panoply of operational modes

TCS SP5 II Broadband confocal microscope

  • Digital Zoom
  • Quantitative Imaging
  • Consistent, high performance
  • Three dimensional visualization
  • Seven objective lenses covering a broad range of magnifications, 10X-100X.

S-3400N II Scanning electron microscope (SEM EDS)

  • Automatic alignments
  • High SE resolution of 10nm at 3kV
  • Dual image display and signal mixing
  • Flexible control of specimen orientation
  • Wide Magnification range, 5X to 300.000X
  • High spatial resolution at low accelerating voltage

M165 FC stereofluorescence microscope

  • Flexible transmitted and reflected illumination
  • Zoom magnification
  • Image coding
  • TripleBeamâ„¢ optics
  • Filters for UV, violet, GFP and red fluorescence
  • Integrated CCD color camera and operating software

TM-1000 Tabletop electron microscope (Tabletop SEM)

  • Auto image adjustment
  • Magnification:20-10.000 X
  • Dual accelerating voltages
  • Ideal for characterizing cell and tissue
  • High-sensitive semiconductor BSE detector

H-7650 Transmission electron microscope (TEM)

  • Easy viewing
  • Easy access
  • High contrast images
  • Integrated CCD camera system
  • Very broad range of magnification to suit different applications
  • Many automated functions and user friendly operating interface


Acquisition of this equipment was supported by the National Science Foundation
under MRI-DBI-0959817, MRI-DBI-0520956, and MRI-DMR-1229558.