Atomic force microscope

Atomic Force Microscope

  • High performance XYZ closed-loop scanning head
  • High scan rates with very low drift and noise
  • Intuitive workflow of the graphical user interface
  • Automated laser and detector alignments
  • Quick and easy sample navigation
  • A panoply of operational modes

Descriptive brochure

Acquisition of this equipment was supported by the National Science Foundation
under MRI-DMR-1229558.